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Webinars

Getting to Know the New MIPI Alliance I3CSM Standard - September 12th 2017 | 10:00am - 11:00am (PDT)
This webinar will provide an overview I3C as a new standard that has advantages in reducing pin count, increasing performance, and decreasing power while achieving some level of backwards compatibility with the long established I2C interface.
(Language: English)

Accelerating TFT and FPD Design - Archive
This webinar will provide an overview of different techniques for TFT and FPD design enabled by the Silvaco EDA tool portfolio. With recent advances in display technology, circuits in display designs have enhanced their functionality and grown rapidly in size.
(Language: English)

Enabling TCAD for TFT, LCD & OLED Display Designs - Archive
This webinar will provide an insight into different TCAD-based simulation techniques that designers of TFT, LCD and OLED display can make use of. First, we will discuss both electrical and optical TCAD simulations of LED/OLED diodes. Next, we will explore LCD simulation and analysis including calculation of transmission patterns at various wavelengths and applied voltages.
(Language: English)

Get a Head Start on Reliability Analysis Early in Your Design Cycle - Archive
This webinar introduces the best practices for ensuring robustness and ease-of-use in performing power, EM and IR drop analysis on various types of IC designs early in the design cycle using simple and minimalistic input data.
(Language: English)

Secrets of Parasitic Extraction Unveiled - Archive
This webinar will review a flow that can qualitatively and quantitatively compare two extraction flavors for the same design. At the end of this session, switching between different layout parasitic extraction tools, calibrating settings to a new technology node, qualifying PDK updates etc will no longer be a bottleneck for CAD teams.
(Language: English)

TCAD Simulation of Organic Optoelectronic Devices - Archive
This webinar will introduce Radiant developed as an integrated simulation environment of LED and OLED devices and will focus on an OLED, which is getting much attention in the field of displays and lighting applications for its excellent efficiency, color quality and color tunability.
(Language: English)

Victory Process 2D - An Innovative Alternative to SUPREM-based Simulators Ensuring Robust 3D Solutions - Archive
Two-dimensional process simulators based on SUPREM-IV from Stanford University have been used in semiconductor research and industry for almost 30 years.
(Language: English)

Statistical analysis flow for analog design with Variation Manager - Archive
The impact of variation on analog design has become critical with the advanced nodes technology. The regular Monte Carlo approach for statistical analysis has reached its limit and can no longer address the needs for analog designers in terms of performance.
(Language: English)

TCAD Simulation of Organic Optoelectric Devices - Archive
This webinar will introduce Radiant developed as an integrated simulation environment of LED and OLED devices and will focus on an OLED, which is getting much attention in the field of displays and lighting applications for its excellent efficiency, color quality and color tunability.
(Language: Japanese)

Power Distribution Network Analysis for Layout Engineers - Archive
This webinar will provide an overview of Silvaco’s new reliability analysis tool InVar Prime. InVar Prime is an addition to the family of InVar power integrity signoff tools.
(Language: English)

TCAD Usability: DeckBuild and Virtual Wafer Fab - Archive
This webinar will give a demonstration of the tools DeckBuild and Virtual Wafer Fab, which are the front end GUI tools to run TCAD simulations.
(Language: English)

TCAD Simulation of Wide Bandgap Power Devices - Archive
Simulation of wide bandgap power devices has always posed convergence challenges. In addition to this, the emphasis is shifting to accuracy and calibration of models in relation to manufacturing data.
(Language: English)

TCAD Simulation of Wide Bandgap Power Devices - Archive
Simulation of wide bandgap power devices has always posed convergence challenges. In addition to this the emphasis is shifting to accuracy and calibration of models relative to manufacturing data.
(Language: Japanese)

Simulation of Physical Etching in Memory Technology - Archive
This webinar will provide a deep insight into the methods, mechanisms and models to simulate physical etching with a special focus on memory technology.

Efficient 3D TCAD Simulation of Silicon Power Devices - Archive
It is well known that TCAD simulation can save time and money since it allows process and device engineers to virtually manufacture any type of devices before processing them. Today, a lot of devices are 3D by “nature” and thus need to be simulated using 3D process and device simulators.

Variation aware design for advanced nodes and low power technologies - Archive
Designers' characterization and verification tasks have become more critical due to scaled down process technologies such as FinFET or FDSOI, and the drive towards lower Vdd/Vth processes.

Easy design migration to Silvaco Custom Design flow via OpenAccess - Archive
This webinar will provide an overview for how circuit designers can use Silvaco's schematic capture tool, Gateway and layout editor, Expert in an OpenAccess environment.

Solar cell modeling using TCAD and SPICE - Archive
In this webinar a review of the TCAD-to-SPICE simulation flow of solar cells and solar panels and its related methodology will be presented.

Partitioning and DRC for 3D systems & ICs - Archive
3D integration of ICs and systems is enhancing cost scaling of “More than Moore” technology and applications. However 3D integration of heterogeneous systems and ICs presents significant challenges to future designers. To that end we introduce two prototype design software for automatic 3D space partitioning of heterogeneous 3D IC designs, and 3D Design Rule Checking (3D DRC).

Power Integrity and Reliability Analysis - Archive
This webinar will provide an overview of Silvaco’s power integrity analysis tool InVar. InVar’s concurrent approach to simultaneous modeling power, voltage and temperature makes reliability analysis real world accurate. This webinar will covergate and transistor level power, EM, IR and thermal analysis from quick design analysis to signoff. Brief introduction to required input data and a short demo will also be presented.

High Voltage Power Device Modeling with HiSIM_HV 2 - Archive
This webinar will provide a comprehensive overview of model parameter extraction for high voltage devices, using the industry standard HiSIM_HV 2 model. HiSIM_HV 2 model parameter effects will be explained first, followed by a step-by-step description of model parameter extraction using Utmost IV. Finally, depletion mode, which is implemented in the latest version of HiSIM_HV 2.2.0 will be introduced.
(Language: English)

High Voltage Power Device Modeling with HiSIM_HV 2 - Archive
This webinar will provide a comprehensive overview of model parameter extraction for high voltage devices, using the industry standard HiSIM_HV 2 model. HiSIM_HV 2 model parameter effects will be explained first, followed by a step-by-step description of model parameter extraction using Utmost IV. Finally, depletion mode, which is implemented in the latest version of HiSIM_HV 2.2.0 will be introduced.
(Language: Japanese)

Simulating Total Dose, Prompt Dose, Damaging Fluence and SEU using TCAD - Archive
This webinar will provide specific approaches for simulating electronic device behavioral changes, including oxide charging and physical damage, during their exposure to four of the most common radiation environments that occur during operation in space or near any other high energy particle or photonic source.

Referenced paper link

Leakage Current TCAD Calibration in a-Si TFTs - Archive
This webinar will outline in detail a calibration procedure used for amorphous silicon Thin-Film Transistors (a-Si TFTs) where TCAD simulations are compared to measurements. We will present a TCAD calibration procedure with emphasis on leakage current, which will help attendees to design and optimize a-Si TFT technology. In this webinar we will review generic and specific physical models used during TFT TCAD simulation including density of states (DOS) and band to band tunneling.

TCAD to SPICE simulation of SiC and Si Power Devices - Archive
This webinar will provide a discussion of the methods used to design, simulate and optimize the performance of power devices using TCAD and SPICE simulations. Silicon has long been the semiconductor of choice for high-voltage power electronics applications. However, wide-bandgap semiconductors such as SiC have begun to attract attention due to their projected improved performance over silicon.

Modeling and Analysis of Single Event Effects - Archive
This webinar will provide a discussion of the methods used by radiation effects engineers to model the space radiation environment and some of its effects on devices and circuits. The remarkable advances in modern device technology creates specific challenges for high–fidelity radiation effects modeling.