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Nanometer Library Characterization: Challenges and Solutions
March 21st 2019 | 10:00am - 11:00am (PDT)

Designers today see a significant increase in the number of simulations and PVT corners required to an accurate library characterization, including new formats to support process variations, that can be critical at advanced process nodes.


TCAD-based Model Extraction Flow for GaN HEMT Devices - Part 2
March 26th 2019 | 10:00am - 11:00am (PDT)

This webinar represents a continuation of a previously presented parameter extraction methodology for GaN HEMT devices.


Introduction to Atomistic Simulation for Nanodevices
April 4th 2019 | 10:00am - 11:00am (PDT)

This webinar will cover several of the most prominent reliability models (available in Silvaco’s TCAD tools). We will review their basic features and key parameters and discuss their correct calibration and comparison to experimental results.