Single Event Burnout (SEB) in a High Voltage PiN Diode : Single Event Burnout (SEB) in a High Voltage PiN Diode

Requires: Victory Device/SEE
Minimum Versions: Victory Device 1.14.1.R

This examples demonstrates Single Event Burnout (SEB) in a High Voltage PiN Diode

The structure of the 3D PiN diode is simple enough to be emulated directly in the device simulator without the need to resort to a full process simulator. Further simplification is afforded by the circular symmetry of the diode allowing the diode to be simulated in two dimensions with cylindrical corrections to correctly predict 3D device characteristics. For the simulation of single events, only a central and vertical strike is a valid candidate for correctly simulating 3D effects using this 2 dimensional circular symetry method. This method is invoked using the cylindrical parameter, on the mesh statement

There are two important requirements for simulating Single Event Burnout (SEB). Firstly, the device IV characteristics must display a "snapback" characteristic, where, for at least a range of voltages, there exists two possible corresponding stable current conditions, one a low current "off" state and a second high current "on" state. At high voltages, the "on" state dissipates sufficient power to over heat the device.

Secondly, self heating plays a leading role in greatly reducing the current density in a PiN diode at which the snapback IV characteristic occurs, allowing a significantly lower Linear Energy Transfer (LET) strike to transfer the diode from an "off" state, to a stable "on" state, where continuous heating eventually burns the device to destruction, hence the name of the phenomenon, "Single Event Burnout".

This example, first biases the PiN diode close to it's breakdown voltage of 3,500 volts. Then a LOOP, L.END statement is used to start the simulation with a strike of 4 MeV-cm2/mg LET. The LOOP then doubles the LET strike value until the current pulse from the strike is sufficient to transfer the IV characteristics to a stable "on" state, whereupon the device burns out in short order afterwards.

To load and run this example, select the Load button in DeckBuild > Examples. This will copy the input file and any support files to your current working directory. Select the Run button in DeckBuild to execute the example.