Experiment versus Simulation

organicex11.in : Experiment versus Simulation

Requires: Blaze/Organic Display
Minimum Versions: Atlas 5.24.1.R

In this example we demonstrated how to simulate charge generation layer ( CGL ) for tandem oled. We simulate the charge generation at the interface between transparent metal oxide semiconductor and hole transport layer using Danielsson interface recombination model. The electron carrier is generated at the MoO3/NPB interface and transported to Alq3(ETL) layer. Hole carriers is only shown in HTL layer from the interface. Inserting MoO3 interlayer significantly modifies the interfacial property. The Danielsson model is only applied to MoO3/NPB interface and effective barrier height is adjusted at Alq3 and MoO3 interface. This assumptionis is well described in many researchers to describe the charge generation at the interface between MoO3 and NPB layer. For transporting generated electron carrier from the interface, we adjusted electron barrier height between Alq3 and MoO3 layer using QN.BARRIER parameter. With these assumption, we can successfully reproduce experimental injection curve shown in reference [1].

[1] Numerical model of tandem organic light-emitting diodes based on a transition metal oxide interconnector layer, Lu Feiping et al., Journal of Semiconductoes, Vol. 35, No. 4, April 2014.

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