Customer Patents

The following patents have been filed by customers using Silvaco tools.

"Transparent nanocrystalline diamond contacts to wide bandgap simiconductor devices"
Hobart; Karl D. April 9, 2009
United States Patent Application: 20090090918

"Thin film transistor, display device having thin film transistor, and method for manufacturing the same"
YAMAZAKI; Shunpei; April 9, 2009
United States Patent Application: 20090090916

"Semiconductor device and manufacturing method thereof"
YAMAZAKI; Shunpei; April 9, 2009
United States Patent Application: 20090090909

"Method of manufacturing laterally graded porous silicon optical filter through diffusion-limited etching and filter structure manufactured thereby"
JEON; Heon Su; April 2, 2009
United States Patent Application: 20090087143

"Determining profile parameters of a structure formed on a semiconductor wafer using a dispersion function relating process parameter to dispersion"
LI; SHIFANG; March 26, 2009
United States Patent Application: 20090083013

"Automated process control of a fabrication tool Using a dispersion function relating process parameter to dispersion"
LI; SHIFANG; March 26, 2009
United States Patent Application: 20090082993

"Generating simulated diffraction signal using a dispersion function relating process parameter to dispersion"
LI; SHIFANG; March 19, 2009
United States Patent Application: 20090076782

"Display device and electronic device having the display device, and method for manufacturing thereof"
Kobayashi; Satoshi; February 12, 2009
United States Patent Application: 20090039352

"Liquid crystal display device"
Yamazaki; Shunpei; January 8, 2009
United States Patent Application: 20090009677

"Light-emitting device"
Yamazaki; Shunpei; January 8, 2009
United States Patent Application: 20090008645

"Dielectric-modulated field effect transistor and method of fabricating the same"
Choi; Yang-Kyu; November 20, 2008
United States Patent Application: 20080283939

"Training a machine learning system to determine photoresist parameters"
Bischoff; Joerg; October 2, 2008
United States Patent Application: 20080243730

"Automated process control using optical metrology and photoresist parameters"
Bischoff; Joerg; October 2, 2008
United States Patent Application: 20080241975

"Determining photoresist parameters using optical metrology"
Bischoff; Joerg; October 2, 2008
United States Patent Application: 20080241974

"Determining one or more profile parameters of a structure using optical metrology and a correlation between profile models and key profile shape variables"
Chard; Jeffrey; July 17, 2008
United States Patent Application: 20080170242

"Automated process control using optical metrology and a correlation between profile models and key profile shape variables"
Chard; Jeffrey; July 17, 2008
United States Patent Application: 20080170241

"High voltage mosfet having Si/SiGe heterojunction structure and method of manufacturing the same"
United States Patent Application: 20080038891

"Device modeling for proximity effects"
United States Patent Application: 20080022237

"Dual work function recessed access device and methods of forming"
Ananthan; Venkatesan; Tang; Sanh D; November 15, 2007
United States Patent Application: 20070264771

"Insulated gate type thyristor"
Rodov; Vladimir; Akiyama; Hidenori; October 11, 2007
United States Patent Application: 20070235752

"Parameter setting method and circuit operation testing method and electronic processing device"
Inoue; Takayuki; Kurokawa; Yoshiyuki; June 28, 2007
United States Patent Application: 20070150250

"Display device and driving method thereof"
You; Bong-Hyun; Han; Min-Koo; October 5, 2006
United States Patent Application: 20060221004

"Self-aligned silicon carbide semiconductor devices and methods of making the same"
Sankin; Igor; et al - May 31, 2007
United States Patent Application : 20070122951

"Generation and use of integrated circuit profile-based simulation information"
Jakatdar; Nickhil; et al. - May 24, 2007
United States Patent Application: 20070118349
Assignee: Tokyo Electron Limited

"Light emitting slot-waveguide device"
Barrios; Carlos Angulo; et al. - May 24, 2007
United States Patent Application: 20070114628
Assignee: Cornell Research Foundation, Inc.

"Gapped-plate capacitor"
Kao; David Y.; et al. -March 15, 2007
United States Patent Application: 20070058325
Assignee: Micron Technology, Inc.

"Fully-depleted (FD) (SOI) MOSFET access transistor and method of fabrication"
Wang; Hongmei; et al. - March 1, 2007
United States Patent Application: 20070045742

"Method of manufacturing a multilayer semiconductor structure with reduced ohmic losses"
Lederer; Dimitri - February 8, 2007
United States Patent Application: 20070032040

"Short-channel transistors"
Sirringhaus; Henning; et al. - January 25, 2007
United States Patent Application: 20070018151

"Circuits and Integrated Circuits Including Field Effect Transistors Having Differing Body Effects"
Shen; Mike Yen-Chao; et al. - January 4, 2007
United States Patent Application: 20070001199
Assignee: Thunderbird Technologies, Inc.

"Light-emitting diode"
Kawazoe; Hiroshi; et al. - November 23, 2006
United States Patent Application: 20060261350

"Electro-optic modulation"
Lipson; Michal; et al. - September 28, 2006
United States Patent Application: 20060215949

"Process for manufacturing a multilayer structure made from semiconducting materials"
Raskin; Jean-Pierre; et al. - July 27, 2006
United States Patent Application: 20060166451

"Structures and methods for fabricating vertically integrated HBT-FET device"
Krutko; Oleh; et al. - June 1, 2006
United States Patent Application: 20060113566

"High voltage mosfet having Si/SiGe heterojunction structure and method of manufacturing the same"
Cho; Young Kyun; et al. - May 18, 2006
United States Patent Application: 20060105528

"Transistor structure and circuit suitable for input/output protection of liquid crystal display device"
Nakazaki; Yoshiaki - January 12, 2006
United States Patent Application: 20060006467

"Synthesizing semiconductor process flow models"
Mouli, Chandra V. - December 1, 2005
United States Patent Application: 20050267622
Assignee: Micron Technology, Inc.

"Method of emulation of lithographic projection tools"
Smith, Adlai H.; et al. - October 27, 2005
United States Patent Application: 20050240895

"Self-aligned silicon carbide semiconductor devices and methods of making the same"
Sankin, Igor; et al. - September 15, 2005
United States Patent Application: 20050199882

"Structures and methods for fabricating integrated HBT/FET's at competitive cost"
Krutko, Oleh; et al. - August 25, 2005
United States Patent Application: 20050184310

"Solid state image pickup apparatus and image pickup system"
Okita, Akira; et al. - August 18, 2005
United States Patent Application: 20050179796
Assignee: CANON KABUSHIKI KAISHA

"Micro-electromechanical systems"
Brunson, Kevin Michael; et al. - June 30, 2005
United States Patent Application: 20050139871
Assignee: QinetiQ Limited

"Gapped-plate capacitor"
Kao, David Y.; et al. -June 9, 2005
United States Patent Application: 20050121740

"Electro-optic modulator on rib waveguide"
Barrios, Carlos Angulo; et al. -April 28, 2005
United States Patent Application: 20050089257

"Use of coefficient of a power curve to evaluate a semiconductor wafer"
Borden, Peter G.; et al. - April 28, 2005
United States Patent Application: 20050088187
Assignee: Applied Materials, Inc.

"Detector for electromagnetic radiation assisted by majority current"
Kuijk, Maarten; et al. - March 10, 2005
United States Patent Application: 20050051730

"Method and apparatus for modeling devices having different geometries"
Chen, Ping; et al. - February 3, 2005
United States Patent Application: 20050027501
Assignee: Cadence Design Systems, Inc.

"Gapped-plate capacitor"
Kao, David Y.; et al. - December 30, 2004
United States Patent Application: 20040264104

"Semiconductor device"
Masuoka, Fujio; et al. - December 30, 2004
United States Patent Application: 20040262681
Assignee: FUJIO MASUOKA

"Apparatus and method for determining the active dopant profile in a semiconductor wafer"
Borden, Peter G.; et al. - December 2, 2004
United States Patent Application: 20040239945

"Self-aligned trench MOS junction field-effect transistor for high-frequency applications"
Yilmaz, Hamza - November 25, 2004
United States Patent Application: 20040232450

"Synthesizing semiconductor process flow models"
Mouli, Chandra V. - November 4, 2004
United States Patent Application: 20040220693
Assignee: Micron Technology, Inc.

"Method for application of gating signal in double gate FET"
Sekigawa, Toshihiro; et al. - September 30, 2004
United States Patent Application: 20040189373
Assignee: NAT. INST. OF ADVANCED INDUSTR. SCIENCE AND TECH.

"Dynamically configurable electrod formed of pixels"
Zhang, Yi; et al. - August 19, 2004
United States Patent Application: 20040159546

"Fully-depleted (FD) (SOI) MOSFET access transistor and method of fabrication"
Wang, Hongmei; et al. - July 15, 2004
United States Patent Application: 20040135204

"Method for predicting performance of integrated circuit and method for designing the circuit"
Sumikawa, Takashi - July 8, 2004
United States Patent Application: 20040133412
Assignee: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.

"Method and apparatus for providing first-principles feed-forward manufacturing control"
Kadosh, Daniel - May 6, 2004
United States Patent Application: 20040088068

"Semiconductor device simulation method, semiconductor device and fabrication method thereof, circuit board, electro-optical apparatus, and electronic device"
Kimura, Mutsumi - April 29, 2004
United States Patent Application: 20040079943
Assignee: SEIKO EPSON CORPORATION

"DEVICE MODELING FOR PROXIMITY EFFECTS"
Adler, Eric; et al. - February 19, 2004
United States Patent Application: 20040034517
Assignee: International Business Machines Corporation

"Method and apparatus for efficient semiconductor process evaluation"
Heydler, Thomas; et al. - January 22, 2004
United States Patent Application: 20040015787

"Fully-depleted (FD) (SOI) MOSFET access transistor and method of fabrication"
Wang, Hongmei; et al. - December 11, 2003
United States Patent Application: 20030227058

"Synthesizing semiconductor process flow models"
Mouli, Chandra V. - November 20, 2003
United States Patent Application: 20030216827
Assignee: Micron Technology, Inc.

"Apparatus for optimized constraint characterization with degradation options and associated methods"
Rao, Guruprasad G.; et al. - November 13, 2003
United States Patent Application: 20030212964
Assignee: Silicon Metrics Corporation

"Simulation method"
Zhang, Hongyong ; et al. - October 23, 2003
United States Patent Application: 20030200071
Assignee: FUJITSU DISPLAY TECHNOLOGIES CORPORATION

"Generation and use of integrated circuit profile-based simulation information"
Jakatdar, Nickhil; et al. - August 28, 2003
United States Patent Application: 20030163295

"Silicon carbide bipolar junction transistor with overgrown base region"
Sankin, Igor; et al. - August 28, 2003
United States Patent Application: 20030160302

"Non-volatile memory device with a polarizable layer"
Hughes, Harold L.; et al. - August 14, 2003
United States Patent Application: 20030153137

"Method and apparatus for selectively providing a semiconductor device with improved breakdown voltage without requiring an additional mask"
Nelson, Shelby F.; et al. - May 15, 2003
United States Patent Application: 20030089953
Assignee: Xerox Corporation

"Apparatus and method for evaluating a wafer of semiconductor material"
Borden, Peter G.; et al. - May 8, 2003
United States Patent Application: 20030085730

"Creation of a polarizable layer in the buried oxide of silicon-on-insulator substrates for the fabrication of non-volatile memory"
Hughes, Harold L.; et al. - May 1, 2003
United States Patent Application: 20030082887

"Gapped-plate capacitor"
Kao, David Y.; et al. - April 24, 2003
United States Patent Application: 20030075751

"Apparatus and method for determining the active dopant profile in a semiconductor wafer"
Borden, Peter G.; et al. - March 6, 2003
United States Patent Application: 20030043382

"Embedded metal nanocrystals"
Kan, Edwin C.; et al. - December 19, 2002
United States Patent Application: 20020192949
Assignee: Cornell Research Foundation, Inc.

"Thin film devices and method for fabricating thin film devices"
Kiziloglu, Kursad; et al. - December 5, 2002
United States Patent Application: 20020182818

"Use of coefficient of a power curve to evaluate a semiconductor wafer"
Borden, Peter G.; et al. - November 14, 2002
United States Patent Application: 20020167326

"Method for calculating the capacity of a layout of an integrated circuit with the aid of a computer, and application of the method to integrated circuit fabrication"
Frerichs, Martin; et al. - October 3, 2002
United States Patent Application: 20020144224

"Apparatus for optimized constraint characterization with degradation options and associated methods"
Rao, Guruprasad G.; et al. - October 3, 2002
United States Patent Application: 20020144214

"Apparatus and methods for constraint characterization with degradation options"
Rao, Guruprasad G.; et al. - October 3, 2002
United States Patent Application: 20020143516

"Apparatus and method for determining the active dopant profile in a semiconductor wafer"
Borden, Peter G.; et al. -July 4, 2002
United States Patent Application: 20020085211

"Hetero-interface avalance photodetector"
Pauchard, Alexandre; et al. - June 6, 2002
United States Patent Application: 20020066938
Assignee: Nova Crystals, Inc.

"MSM device and method of manufacturing same"
Henning, Jason P. - May 16, 2002
United States Patent Application: 20020056853

"Fabrication of a high-precision blooming control structure for an image sensor"
Burke, Barry E.; et al. - April 25, 2002
United States Patent Application: 20020048837

"Apparatus and methods for characterizing electronic circuits having multiple power supplies"
Najm, Farid N.; et al. - April 11, 2002
United States Patent Application: 20020042704

"Offset drain fermi-threshold field effect transistors"
RICHARDS, JR., WILLIAM R.; et al. - March 28, 2002
United States Patent Application: 20020036328

"High frequency field effect transistor with carrier extraction to reduce intrinsic conduction"
Ashley, Timothy; et al. - February 7, 2002
United States Patent Application: 20020014633

"Apparatus for modeling IC substrate noise utilizing improved doping profile access key"
Lescot, Jerome D.; et al. - January 17, 2002
United States Patent Application: 20020006714

"Apparatus for modeling IC substrate noise"
Clement, Francois J.R. - November 15, 2001
United States Patent Application: 20010041428
Assignee: Snaketech, Inc.