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Volume 6, Number 1, January 1995
Extracting BSIM3 Model Parameters Using UTMOST
Analog Behavioral Simulation Using SmartSpice
Hints & Tips
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Volume 6, Number 2, February 1995
Simulation of Irradiation Effects in IGBTs with ATLAS
VWF Production Tools Bring VWF Capability Closer to Manufacturing Reality
Extraction of DC and AC SPICE Model Parameters From HBT Devices using the VWF
Hints & Tips
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Volume 6, Number 3, April 1995
2D Simulation of Pseudomorphic Heterojunction Devices Using The Fully Coupled Carrier Energy Balance Model
Automatic Layout to SPICE 3D Interconnect Modeling
Monte Carlo Based Ballistic Deposition Model
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Volume 6, Number 4, May 1995
A Preliminary Analysis of the BSIM3 Version 3 MOSFET Model using UTMOST
Low Power MOSFET Modeling Using the EKV Model
Statistical Parameter Analysis for a Process Under Development Using SPAYN
Linking Models Dynamically to UTMOST
Hints & Tips
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Volume 6, Number 5, June 1995
Complete Simulation of SOI MOSFETs Using Nonisothermal Energy Balance
3D Device Simulation Using ATLAS/Device3D
The 1995 Software Release Features Strengthened and Expanded Virtual Wafer Fab
A Practical Example of VWF Methodology
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Volume 6, Number 6, July 1995
An Investigation of the Suitability of PCA Results Obtained from Selected Wafer Lots to Characterize Future Wafer Lots.
Features of the SmartSpice Interpreter
BSIM3 Version 3.0 (Beta) Available to UTMOST Users
Modeling Bipolar Devices Using the MEXTRAM Model
Hints & Tips
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Volume 6, Number 7, August 1995
ISEN Advanced Diffusion and Oxidation Models Slated for Inclusion in ATHENA
2-D Simulation of Ion Irradiated Silicon Power Devices
Analysis and Calibration of LOCOS Simulation using VWF
KTH Advances TCAD Program in Sweden
Quasi-3D Thyristor Latch-Up Simulations
Application of MixedMode Simulation to High Frequency Bipolar Characterization
Using the VWF Production Tools - Technology Objects
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Volume 6, Number 8, September 1995
Introducing New Device Models into SmartSpice and UTMOST Using the SmartSpice Interpreter
Plotting UTMOST Results using TonyPlot
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Volume 6, Number 9, October 1995
Polysilicon Diffusion Model
Device Modeling of PNP HBT Using ATLAS
Using The Power Of The Interactive Tools: Part 1deckBuild
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Volume 6, Number 10, November 1995
Extraction of Scalable Temperature Independent BSIM3 (Version 3) and Philips Level 9 MOSFET Models Using UTMOST
Comparing Worst-Case Models Generated by SPAYN to Models Derived Using Traditional Methods
A New Method for Extracting Reverse Transit Time (TR) in Bipolar Transistors
Hints & Tips
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Volume 6, Number 11, December 1995
Automated TCAD Calibration Procedure Using A Combination of VWF Automation and Production Tools
A User's Perspective on Simulator Calibration
Single-Event Gate-Rupture in Power MOSFETs: Prediction of Breakdown Biases and Evaluation of Oxide Thickness Dependence
The Simulation of Wide Band Gap Semiconductor Materials for Use in High Temperature and Other Applications
Device Simulation of a Trench-IGBT with Integrated Diverter Structures
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