SPAYN

1 Year Development Roadmap, 2011

Parameter and Attribute management

• Improve / manage duplicate value behavior (include, average, remove)

Plot and data analysis

• Rewrite wafer map color range management
• Improve histogram plot to:
  • overlay multiple distributions
  • add multiple attributes marker
• Add log scale support in scattergram plot
• Improve regression analysis:
  • Add support for X transform
  • Determine best transform
    

Simulation Interface

• Use DOE from VWF
• JavaScript scripting language integration for task automation