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SPAYN:

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90 Day | 1 Year | 3 Year

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See Also:

VWF
Virtual Wafer Fab

UTMOST III
SPICE Modeling Software

UTMOST IV
Optimization Module for Compact / Macro-Modeling

SPICE Modeling Services

SPAYN and its Competitors

Agilent IC-CAP statistics package, BTA SIGMAPro

SPAYN (Statistical Parameter and Yield Analysis) is a statistical analysis and non-linear modeling tool. SPAYN analyses variances from model parameter extraction sequences, electrical test routines, and circuit test measurements. SPAYN can be used in place of Agilent IC-CAP statistics package or BTA SIGMAPro technology. Unlike SAS, SPSS, SYSTAT, MINITAB or DATADESK that require doctorate-level statisticians, SPAYN is a comprehensive, user friendly tool with advanced, flexible and powerful feature tailored for the semiconductor industry.

Key Features

• Helps to identify the relationship between device or circuit performance variations and the process fluctuations.
• Parametric analysis includes Principal Component Analysis (PCA), Principal Factor Analysis (PFA)
• Multiple linear and nonlinear regression.
• Automatic generation of worst-case and corner SPICE models
• Identification of inter-relationship among groups of parameters
• Statistical process control, process monitor, and yield analysis
• Advanced Wafer Map displaying wafer-to-wafer and die-to-die variances
• Seamless integration with fast SmartSpice API for statistical circuit design
• Flexible data input, output, append, merge, and split options.
• Golden Sample close to the mean calculation
• Monte Carlo Analysis
• Corner and Parametric Boundary Modeling
• Advanced histogram, 2D & 3D scatter plot and response surface model display options
• Integrated with Silvaco VWF Software for smooth development of pre-silicon models

Agilent IC-CAP stats package, BTA SIGMAPro, SAS SPSS, SYSTAT, MINITAB and DATADESK are trademarks of their respective owners.